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The effects of ultraviolet exposure on the device characteristics of atomic layer deposited-ZnO:N thin film transistors

Title 
The effects of ultraviolet exposure on the device characteristics of atomic layer deposited-ZnO:N thin film transistors
Authors 
Do Young Kim
Authors 
Jae-Min Kim; S.J.Lim; Tae Wook Nam; Hyung Jun Kim
Issue Date 
2011
Publisher 
Electrochemical society, INC
Journal 
Journal of the electrochemical society
Vol. 
158
Issue 
5
Pages 
J150
URI 
http://dx.doi.org/10.1149/1.3560191
http://repository.uc.ac.kr/handle/2014.oak/471
ISSN 
0013-4651
Appears in Collections
15. 전기전자공학부 > 연구논문

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