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Improvement of mechanical reliability by patterned silver/Indium-Tin-Oxide structure for flexible electronic devices

Title 
Improvement of mechanical reliability by patterned silver/Indium-Tin-Oxide structure for flexible electronic devices
Authors 
Do Young Kim
Authors 
Kyunghyun Baek; Kyung Soo Jang; Youn- Jung Lee; Kyung Yul Ryu; Woo Jin Choi; Jun Sin Yi
Keywords 
Stress corrosion, Cracking, Indium-Tin-Oxide, Silver, Flexible optoelectronic devices, Young's modulus
Issue Date 
2013
Publisher 
Elsevier science
Journal 
Thin solid films
Vol. 
531
Pages 
349-353
URI 
http://dx.doi.org/10.1016/j.tsf.2012.12.075
http://repository.uc.ac.kr/handle/2014.oak/504
ISSN 
0040-6090
Appears in Collections
15. 전기전자공학부 > 연구논문

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